Product Info

The AIRIS-SP, a surface defect inspection device from the AIRIS ACE series, offers an optimal solution for inspecting high-quality products, including separator films. This device enhances the functionality to detect fine defects that are difficult to discern with high precision and is equipped with an image processing simulation function. This streamlines the quality control process, leading to improved production efficiency and stabilized product quality.

■ Features
Detection Parameters for Separator Films: Achieves more precise inspections with detection parameters tailored to the product characteristics.
Enhanced Functionality for Hard-to-Detect Defects: Reliably detects fine and easily overlooked defects.
Equipped with Image Processing Simulation Functionality: Allows for simulation of the inspection process before actual implementation, enabling the setting of optimal inspection conditions.
Multi-language Support on the Same Platform: Compatible with Japanese, English, Chinese, and Korean, making it suitable for use in manufacturing lines worldwide.

■ Specifications
Model: AIRIS-SP
Supported Languages: Japanese, English, Chinese, Korean
Features: Detection parameters for separator films, image processing simulation, multi-language support
Application Fields: Separator films and other products requiring high-precision surface inspection
The AIRIS-SP is a reliable inspection device that does not miss any fine defects that can impact product quality. Utilizing the latest technology, it supports your quality control process.

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